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Lightweight Model for MLCC Appearance Defect Detection

Lightweight Model for MLCC Appearance Defect Detection

Researchers from China and Japan proposed a “lightweight and multi-scale model for MLCC appearance defect detection” in their work published by Optics & Laser Technology Journal. Introduction Multilayer ceramic capacitors Read the original post at Lightweight Model for MLCC...

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October 25 Electronics Production: U.S. vs. Global Changes

October 25 Electronics Production: U.S. vs. Global Changes

U.S. electronics production has grown significantly, driven by a shift in manufacturing from other countries, particularly due to tariff policies according to Semiconductor Intelligence report. However, this growth hasn’t translated Read the original post at October 25 Electronics Production:...

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