Tomáš Zedníček

Supercapacitor Degradation and Reliability

source: Brno University of Technology CEITEC, EPCI e-Symposium Abstract: Degradation of supercapacitor (SC) is analyzed by accelerated aging test. Evolution of SC parameters is determined before the aging test, and during up to 8 x 105 cycles of...

Project for Energy Storage on a Chip for MEMS

source: FEEC Brno University of Technology, EPCI e-Symposium Abstract: A new project with a budget of 262 thousands Euro was motivated by the lack of micromachined energy storage solutions that can be integrated with a MEMS harvester on...

Commercial vs. Hi-Rel Tantalum Capacitors in Space Applications

source: Kemet Electronics, EPCI e-Symposium Abstract: There are several grades of electronic components that depends on their long-term reliability and resistance to harsh environments, including commercial, automotive, high reliability COTS, and MIL. This paper describes the differences in...

Parametric Failures in COTS Capacitors

source: ASRC Federal Space and Defense (NASA,USA), EPCI e-Symposium Abstract: Insertion of COTS components into hi-rel systems require extensive environmental testing of the parts that often results in parametric failures.  Based on experience with commercial and hi-rel PME...

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