source: Serma Technologies, EPCI e-Symposium
Abstract:
SERMA TECHNOLOGIES is presenting failure statistics of all return parts analyzed during the last 5 years. For each family of passives components ( ceramic, tantalum, film capacitors and resistors) , percentage of defect will be given. The origin of defect (suppliers, board assembly process, or environment ) will also be discussed. Specific technics was also developed to address precise failure mode : for example, voltage contrast was developed for ceramic capacitors to state on inhomogeneous dielectric materials defect.
Title: Feedback from an Independant Laboratory on Passives Components Failure Analysis from All Industry Sectors
Authors: Eric Zaia, Beatrice Moreau
Organisation(s): Serma Technologies
Symposium: 1st PCNS Passive Components Networking Days, 12-15th Sep 2017, Brno, Czech Republic
Reference: Plenary paper I., Keynote Speech, PCNS2017 Proceedings Pg.2-7
ISBN: 978-80-905 768-8-9
e-Sessions Applications: Aerospace, Industrial, Medical, Automotive, Commercial
e-Sessions Scope Components: Capacitors, Resistors
e-Sessions Topics: Quality & Reliability
more 1st PCNS symposium technical papers can be viewed and downloaded in pdf from EPCI Academy e-Proceedings:
