Climatic Reliability of Electronic Components – Solution of the Challenge
Full paper download The paper compares two ways to increase the robustness of assembly against ECM electrochemical migration. In the paper, we underline some challenges in gap cleaning. We describe state-of-the-art methods of cleaning process control and diagnostics, which move the cleaning process from randomly controlled to very safe with stable results. The paper was presented by Vladimir Sitko, PBT Works s.r.o., Rožnov pod...
























