Overcoming the Challenges of Using Sub-Milliohm SMD Chip Resistors

Overcoming the Challenges of Using Sub-Milliohm SMD Chip Resistors

This paper was presented by Stephen Oxley, TT Electronics at the 3rd PCNS 7-10th September 2021, Milano, Italy as paper No.3.1. and voted by attendees as: OUTSTANDING PAPER AWARD The most cost effective and simplest way of converting a measured current to a voltage signal is to use a low ohmic value current sense resistor. The increase in products containing batteries, motors or actuators...

Supercapacitors: Applications in Space, Development Conducted by ESA and Challenges to Overcome

Supercapacitors: Applications in Space, Development Conducted by ESA and Challenges to Overcome

Since almost a decade, supercapacitors (SC) were identified as promising high-power sources as they can bridge the gap between capacitors and batteries. SC have been found to be potentially attractive for several space power applications. ESA has conducted several activities for developing supercapacitors for space applications. In this paper, an overview of identified space applications for SC will be provided, the conclusions of recent...

Acceleration Factors for Reliability Assessment of Polymer Tantalum Capacitors

Acceleration Factors for Reliability Assessment of Polymer Tantalum Capacitors

Using polymer tantalum capacitors in Hi-Rel systems requires an assessment of the reliability characteristics of the parts. For this assessment, tantalum capacitors are typically subjected to reliability testing at temperatures and voltages exceeding their specified values, and the failure rate (FR) — or the probability of failure during use conditions — is calculated based on voltage and temperature acceleration factors. In this work, various...

Reliability Assessment of Cracks in Ceramic Capacitor in Space Condition

Reliability Assessment of Cracks in Ceramic Capacitor in Space Condition

Cracks in MLCC ceramic capacitor are, unfortunately, a well know phenomena that can depend to several factors. It is believed to reduce the reliability of the capacitor leading to catastrophic failure like short circuit. When cracked capacitors are found in space projects the usual practice is to replace the defective parts and/or to solve the root cause of the problem as for example by...

Reliability and Failure Mode in Solid Tantalum Capacitors

Reliability and Failure Mode in Solid Tantalum Capacitors

The reliability and failure modes in surface mount Solid Electrolytic and Polymer Tantalum capacitors were investigated using the parts manufactured with conventional technology and flawless technology (F-Tech) that suppresses typical defects such as crystalline inclusions in the amorphous matrix of the tantalum oxide dielectric. The paper was presented by Yuri Freeman, KEMET Electronics Corporation. USA at the 3rd PCNS 7-10th September 2021, Milano, Italy...

Page 260 of 293 1 259 260 261 293