Temperature Dependence of Leakage Current Degradation of Tantalum Capacitors at High Electric Field
source: Brno University of Technology CEITEC, AVX Czech Republic s.r.o., EPCI e-Symposium Abstract: Tantalum capacitors have been the preferred capacitor technology in long lifetime electronic devices thanks to the stability of its electric parameters and high reliability. However, long time application of elevated temperature and high electric field can result in capacitor leakage current increase in time. In this paper the effect of ions...