A New Screening Method to Detect Pattern Defects in Bulk Metal Foil or Thin Film Resistors
source: ASRC AS&D at NASA Goddard Space Flight Center; ESA SPCD 2018 Symposium EPCI e-symposium library article Bulk metal foil and thin film resistors occasionally contain localized defects within the etched resistor pattern. Such defects are prone to fracture due to thermo-mechanical fatigue during powered operation, however common screening methods are not always effective at removing devices with such defects. An improved method has...