Kinetics of Moisture Sorption and Reverse Bias Degradation in Chip Tantalum Capacitors
source: ASRC Federal Space and Defense (NASA), EPCI e-Symposium Abstract: Exposure of chip MnO2 tantalum capacitors to humid environments might result in increased ESR, leakage currents, and first turn-on failures. However, there is a lack of literature data on the effect of moisture on reverse bias behavior of the parts. The presence of moisture can also result in pop-corning when a high water vapor...