Reliability and Failure Mode in Solid Tantalum Capacitors
The reliability and failure modes in surface mount Solid Electrolytic and Polymer Tantalum capacitors were investigated using the parts manufactured with conventional technology and flawless technology (F-Tech) that suppresses typical defects such as crystalline inclusions in the amorphous matrix of the tantalum oxide dielectric. The paper was presented by Yuri Freeman, KEMET Electronics Corporation. USA at the 3rd PCNS 7-10th September 2021, Milano, Italy...