Supercapacitor Degradation and Reliability

source: Brno University of Technology CEITEC, EPCI e-Symposium Abstract: Degradation of supercapacitor (SC) is analyzed by accelerated aging test. Evolution of SC parameters is determined before the aging test, and during up to 8 x 105 cycles of both 75% and 100% energy cycling. Capacitance fading, equivalent series resistance (ESR) increase, and leakage current trend are analyzed for off-the-shelf CapXX SC.   Presented model...

Investigation of Supercapacitor’s Impedance Based on Spectroscopic Measurements

source: University “Politehnica” of Bucharest, EPCI e-Symposium Abstract: Current trends in supercapacitor technology (principially in lowering series discharge resistance) have promoted the devices into roles parallel to, or replacing traditional batteries. In cases where power consumption is low, supercapacitors are an attractive alternative, completely eliminating batteries and further offering higher surge currents. This opens the path towards powering mobile switching circuits, or with high-consumption...

Assessment of Supercapacitor’s Quality by Means of Low Frequency Noise

source: Gdańsk University of Technology, EPCI e-Symposium Abstract: Low frequency noise is a well-known tool for quality and reliability assessment of electronic devices. This phenomenon is observed in different electrochemical devices as well (e.g., smart windows, electrochemical corrosion processes). Thus, we can assume that the same tool can be used to asses quality of supercapacitors. Their quality is usually determined only by capacitance and/or...

Project for Energy Storage on a Chip for MEMS

source: FEEC Brno University of Technology, EPCI e-Symposium Abstract: A new project with a budget of 262 thousands Euro was motivated by the lack of micromachined energy storage solutions that can be integrated with a MEMS harvester on a chip with a specific circuitry. These key components of the system are highly needed for autonomous microsystems and have to be integrated to enable an...

Commercial vs. Hi-Rel Tantalum Capacitors in Space Applications

source: Kemet Electronics, EPCI e-Symposium Abstract: There are several grades of electronic components that depends on their long-term reliability and resistance to harsh environments, including commercial, automotive, high reliability COTS, and MIL. This paper describes the differences in qualification and testing requirements for different grades of Tantalum capacitors and how these differences affect the materials, processes, and cost involved in their manufacturing.  This paper...

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